Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_left View Search Results  
Email/Printer Friendly Format  
 

Data representation and organization for an industrial multisensor integration architecture

Naish, M.D.   Croft, E.A.  
Dept. of Mech. Eng., British Columbia Univ., Vancouver, BC, Canada;
This paper appears in: Systems, Man, and Cybernetics, 1997. 'Computational Cybernetics and Simulation'., 1997 IEEE International Conference on
Publication Date: 12-15 Oct. 1997
Volume: 1
On page(s): 821 - 826 vol.1
Meeting Date: 10/12/1997 - 10/15/1997
Location: Orlando, FL
ISBN: 0-7803-4053-1
Digital Object Identifier: 10.1109/ICSMC.1997.626200
Current Version Published: 2002-08-06

Abstract
An open architecture for intelligent multisensor integration in an industrial environment is being developed. A logical sensor model is used to represent both real and abstract sensors within the architecture, allowing for the ready addition or replacement of sensors. Processing algorithms are also encapsulated by logical sensors. Objects are modeled using a connected graph structure wherein each node represents a salient feature of the object. Interactive training is used to determine the logical sensors required to extract desired features from objects. Extracted features are identified by the user and become part of the model. Once trained, the system can use object models for identification and classification purposes

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text PDF icon
Full Text: PDF (552 KB)
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Rights and Permissions>
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_left View Search Results  
Indexed by IEE Inspec
© Copyright 2010 IEEE – All Rights Reserved